GaAs

GaAs

 英

  • 网络砷化镓;砷化钾;砷化稼

例句

GaAs FET Oscillator stabilized by a dielectric resonator with a feedback loop has been developed.

本文介绍一种环路反馈效应介质振荡

when the feed rate is larger, line speed on the surface have little effect on the roughness of GaAs films. 2.

速度较大提高线速度单晶表面粗糙度影响不大

The design of the broadband GaAs PHEMT monolithic true-time delay was described.

简要介绍实时延迟线电路基本概念电路设计流程进行阐述

In this paper , a small Hall current sensor made from a GaAs Hall component is introduced.

介绍一种利用霍尔元件设计微型霍尔电流传感器

With the progress of the CMOS process, the CMOS RF process can compare with the traditional RF process like Bipolar, GaAs and so on.

随着CMOS工艺不断进步CMOS射频工艺传统射频工艺双极工艺GaAs工艺

GaAs grown at low temperature, 24 the slowly recovering component observed in the ?

增长材料温度、24日慢慢恢复组件观测到?。

When the feed rate is small, the increased of cutting speed can significantly improve the surface roughness of GaAs chips;

进给速度小时提高切割线速度可以显著提高单晶表面粗糙度

Commercial GaAs epitaxial layers are of good enough quality that losses due to material and interface perturbations are negligible

GaAs外延质量相当材料界面起伏引起损耗忽略不计

GaAs semiconductor Generator rotator Temperature measuring system;

半导体发电机转子测温系统

gallium arsenide metal semiconductor field effect transistor(GaAs MESFET)

金属半导体效应晶体管

Theoretical Analysis of Gain and Threshold Current Density for Long Wavelength GaAs-Based Quantum-Dot Lasers

GaAs波长量子激光器增益阈值电流密度理论分析

Review and Prospect of Dryland Eco-Agriculture Research of Dingxi Experimental Station, GAAS, China

定西试验生态研究回顾展望

Stoichiometry in SI-GaAs Bulk Materials by Triple Axis Mode X-Ray Diffraction Measurements

X射线衍射测量绝缘GaAs单晶化学配比

Progress on the material structure design of GaAs-based quantum cascade lasers

GaAs量子级联激光器材料结构设计进展

GAAS Generally Accepted Auditing Standard

通用审计标准

evidenced on GaAs-based compounds, 23 at a higher defect density the band structure is modified to

GaAs-based化合物、23缺陷密度结构修改

gallium arsenide (GaAs) injection laser

注入

Determination of Milligram As and Se in Drinking Water by GAAS

石墨原子吸收快速测定饮用水微量

The measurement of thermally stimulated current in SI-GaAs

绝缘电流测量

Analyses of Surface Damage in SI-GaAs Wafers

晶片表面损伤分析

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