ellipsometry
美 [ɪlep'sɒmətrɪ] 
英 [elɪp'sɒmɪtrɪ]
- n.椭圆偏振计测量；椭圆计测量；椭圆率测量术；椭圆对源
- 网络椭圆偏振技术；椭圆光度法；椭圆偏光仪
英汉解释
例句
Owing to its advantages, ellipsometry and automatic ellipsometers can be used in many other fields and will gain good results.
并且，自动椭偏仪在其他领域的测量应用前景也很好。
The electro-optic index of PLZT thin films was measured by means of modulated ellipsometry.
利用调制式的椭偏仪测量了掺镧锆钛酸铅PLZT薄膜的电光系数。
To attain high precise optical parameters of thin films, it's necessary to solve data processing in ellipsometry.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。
Imaging technique, interferometric method and ellipsometry are used in the defect detection of the thin film.
在薄膜缺陷检测领域，成像技术，干涉测量，椭偏测量等一系列测量手段都得到了应用。
SCI offers diverse tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry.
为薄膜设计，材料分析，椭圆偏光法，分光光度测定法提供不同的工具。最近的光学薄膜软件包括：一。
Spectroscopic imaging ellipsometry (SIE) is used to characterize a nano film pattern on a solid substrate.
提出一种对固相基底上纳米薄膜图案进行表征的光谱椭偏成像系统。
Study on optical properties of diamond films by means of infrared spectroscopic ellipsometry
金刚石薄膜的红外椭圆偏振光谱研究
Paints quality , Plastics , Polymer, Optical Brighteners and Phosphor Coatings ( Ellipsometry )
油漆质量，塑料，聚合物，荧光增白剂和磷涂层（椭圆偏振仪）
Research on dynamic reflecting spectroscopic ellipsometry and its application in the measurement of thin films
动态椭偏光谱技术及其在薄膜测量中应用的研究
Automatic Ellipsometry Measurement Instrument for Anisotropic Materials
各向异性材料光学常数全自动椭偏测仪
Study of heterodyne ellipsometry for nanometer film measurement
纳米厚度薄膜外差椭偏测量技术的研究
Study on Aniline Electrochemical Polymerization with Potential Scanning Ellipsometry
电位扫描椭圆法对苯胺电聚合的研究
Spectroscopic Ellipsometry Investigations of Amorphous Diamond Films Deposited with Filtered Arc
过滤电弧沉积非晶金刚石薄膜的光谱椭偏研究
Study of fabrication and spectroscopic ellipsometry of SBN thin films
铌酸锶钡薄膜制备及椭偏光谱研究
Spectroscopic Ellipsometry Theory of Anisotropic Thin Films
各向异性择优取向薄膜的椭偏光谱术理论
Direct Calculation Method of Measuring the Reflective Index and the Thickness of the Rough-Surface Films by Ellipsometry
直接计算法计算粗糙面薄膜的折射率和厚度
Packaging: Barrier Coating for Food Plastic Films, Bottles ( Ellipsometry )
包装：食物包装用塑料膜、瓶子的保护涂层（椭圆偏振仪）
Improving ellipsometry precision by correctly using multi-times measurement
正确使用多次测量法提高椭偏测量精度
Effects of deposition conditions on infrared spectroscopic ellipsometry of CVD diamond films
沉积工艺条件对金刚石薄膜红外椭偏光学性质的影响
Advanced Characterization of Thin Film by Spectroscopic Ellipsometry
椭圆偏光光谱仪：先进的薄膜表征方法
Study on Heterodyne Transmission Ellipsometry and Nonlinearity Error
透射式外差椭偏测量及非线性误差分析
The optical constants of GaN film investigated by spectroscopic ellipsometry
GaN薄膜光学常数的椭圆偏振光谱研究
GaN epilayer by infrared spectroscopic ellipsometry
GaN外延膜的红外椭偏光谱研究
Deposition and erosion study on amorphous hydrocarbon films by in situ ellipsometry
用在线椭偏仪研究非晶碳氢膜沉积和刻蚀过程
Application of ellipsometry in researches of biomedicine
椭圆偏振术在生物医学研究中的应用
The Refractive Index Measurement of Polymer Films with Ellipsometry
椭偏法测试聚合物薄膜折射率的研究
Oriented Immobilization of Human IgG by Protein A on Imaging Ellipsometry Biosensor
A蛋白定向固定抗体用于椭偏光学生物传感器免疫检测
An Overview and Prospect on Modern Spectroscopic Ellipsometry
现代椭偏光谱学的回顾与展望
Ellipsometry design and data analysis of the monitoring system of thin wire on-line measuring
椭偏法细丝在线监测系统设计及数据分析
Improving the precision of optical parameters of thin films in ellipsometry by using the modified Simulated-Annealing data processing
使用修正的模拟退火数据处理以提高椭偏测量中薄膜参数的精度
Study on Heterodyne Ellipsometry and Error Analysis of Frequency Mixing
外差椭偏测量技术及其混频误差分析
Study on the Adsorption of Collagen onto Surfaces with Imaging Ellipsometry
椭偏光学显微成像法研究胶原在表面的吸附
Studies on the Deposition of Cerium on Oxide Coatings of Aluminum Alloy by Ellipsometry
铝合金氧化膜上沉积铈的椭圆法研究
VFSA Application in Ellipsometry Data Computing and the Improvement Tactics of the Algorithm
非常快速模拟退火算法在椭偏数据处理中的应用及其改进策略研究
Optical Constant Measurement of Thin-metal Films by Ellipsometry
薄金属膜光学常数的椭偏法测定
A microarray biosensor based on imaging ellipsometry and its applications
基于椭圆光度法成像原理的微阵列生物传感器及其应用
Ellipsometry Study on the ZnO Thin Film Prepared by A Novel Sol-Gel Method
一种新型溶胶-凝胶方法制备ZnO薄膜的椭圆偏振光谱研究
Study on Optical Properties of Diamond-Like Carbon with Ellipsometry
类金刚石薄膜光学特性的椭偏法研究
Uniformity over Film Area and Depth ( Ellipsometry )
薄膜平面方向和深度方向的均匀性（椭圆偏振仪）
Polymer Thin Film Growth on Si Substrate ( Ellipsometry )
Si衬底上聚合物薄膜生长（椭圆偏振仪）
